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An Office of Science User Facility
 

 CXI Beamline Sections

 
Acronym Full Name Devices Purpose
XRT:DIA
DIAgnostics stand in the X-Ray Tunnel
  • Pulse Pickerulse er
  • Attenuators (10 filters)
  • X-ray Focusing Lenses
  • Rapidly shutter the x-ray beam
  • Control the incident beam intensity
  • Pre-focus the x-ray beam or produce a ~10 micron focus at CXI
​DG1 DiaGnostics stand 1
  • Reference Laser
  • Slits 1
  • Profile-Intensity Monitor
  • Differential Pump
  • Produce a visible reference line for alignment
  • Slit the beam down and reduce unwanted halo, Define the beam entering the KB mirrors
  • Measure the incidnet beam profile entering the CXI hutch
  • Separate the vacuum of the KB mirrors from the upstream beamline
​KB1 ​1 micron KB mirrors
  • Slits 2
  • 1 micron KB mirrors
  • Slits 3
  • Slit the beam down and clean the beam before entering the KB mirrors
  • Focus the x-ray beam to a ~1 micron spot
  • Slit the beam down and clean the beam entering the KB01 mirrors or the beam exiting the KB1 mirrors
​KB01 or KB2 0.1 micron KB mirrors
  • ​100 nm KB mirrors
  • ​Focus the x-ray beam to a ~100 nm spot
​SC01 or SC2 ​0.1 micron Sample Chamber
  • ​100 nm interaction region
  • ​Location of the ~100 nm focus
​DSA ​Detector Stage (A location)
  • ​Full size CSPAD
  • X-ray Focusing Lenses
  • Attenuator or beam stop
  • ​Forward scattering measurements with the nanofocus chamber
  • Refocusing or collimating the 100 nm focus for reuse downstream
  • Attenuate the beam passing through the CSPAD hole or block it entirely
​DG2 ​DiaGnostics stand 2
  • ​CSPAD 140K or X-ray Focusing Lenses
  • Slits 4
  • Intensity-Position Monitor
  • Profile-Intensity Monitor
  • Differential Pump
  • ​Measure the low angle forward scattering from the 100 interaction region

or 

  • Change the divergence of the 1 micron KB beam and control the spot size in SC1
  • Slit the beam down after the refociusing lenses or clean the beam before after the 1 micron KB mirrors
  • Non-destructive relative measurement of the pulse intensity
  • Measure the beam profile on the way to the 1 micron focus, after the 100 nm focus or after the refocusing lenses
  • Isolate the 1 micron sample chamber environment from the upstream part of the beamline
​DSB ​Detector Stage (B location)
  • ​Full size CSPAD

OR

  • Time Tool
  • Pulse Selector
  • Attenuators (6 filters)
  • Slits 5
  • Differential Pump
  • ​Back scattering measurements with the 1 micron focus

OR

  • Cross-correlate the arrival time of the x-rays and pump lasers
  • Rapidly shutter the x-ray beam or control the repetition rate for SC1
  • Control the incident beam intensity
  • Slit the beam down after the refociusing lenses or clean the beam before after the 1 micron KB mirrors
  • Isolate the 1 micron sample chamber environment from the upstream part of the beamline
​SC1 ​1 micro Sample Chamber
  • ​1 micron interaction region
  • ​Location of the ~1 micron focus and of the refocused 100 nm beam
​DSC ​Detector Stage (C location)
  • ​Full size CSPAD (Front detector for SC1)
  • Attenuator or beam stop

Coming Soon

  • Pulse Selector for refocused 1 micron beam
  • X-ray focusing lenses for refocusing or collimating the 1 micron focus
  • ​Forward scattering measurements with the micron focus chamber (High angle detector)
  • Attenuate the beam passing through the CSPAD hole or block it entirely

Coming Soon

  • Rapidly shutter the x-ray beam or control the repetition rate for SSC
  • Refocusing or collimating the 1 micron focus for reuse downstream
SSC or SC3 ​Serial Sample Chamber
  • ​Interaction for refocused 1 micron beam
  • ​Location of the refocused 1 micron beam
​DSD Detector Stage (D location)
  • ​Full size CSPAD (Back detector for SC1)

OR

  • Full size CSPAD (Detector for SSC)
  • Attenuator or beam stop
  • ​Forward scattering measurements with the micron focus chamber (Low angle detector)

OR

  • Forward scattering measurements with the refocused beam in SSC
  • Attenuate the beam passing through the CSPAD hole or block it entirely
​DG3 ​DiaGnostics stand 3
  • ​Single Shot Spectrometer
  • ​Measure the single shot x-ray spectrum
​DG4 ​DiaGnostics stand 4
  • ​Intensity-Position Monitor
  • Profile-Intensity Monitor
  • ​Non-destructive relative measurement of the pulse intensity
  • Measure the beam profile at the end of the CXI hutch, after all focusing optics and all interactions with samples or diagnostics

SLAC SLAC National Accelerator Laboratory, Menlo Park, CA
Operated by Stanford University for the U.S. Dept. of Energy