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X-ray energies ranging from 250 to 2000 eV will be available. The SXR monochromator has a resolving power (E/ΔE) of 1000-2000 depending on the photon energy and will be available as part of the standard configuration. Additionally, zeroth order, full SASE beam will be available.
SXR’s KB focusing system can provide foci up to 2 micron (FWHM) and is adjustable in size up to several hundreds of micrometers FWHM.
Time-resolved experiments employing tunable femtosecond pulses will be supported under this standard configuration. The fundamental and harmonics (800, 400 and 267 nm) of the SXR, ~50 fs Ti:Sapphire laser will be available, delivered to the sample collinearly with the x-rays, with in-coupling ~800 mm upstream of the sample and with the focusing lens ~1000-1200 mm away from the sample. The configuration can also be used with a TOPAS-Prime Optical Parametric Amplifier (OPA) capable of 480-2400 nm wavelengths. Again, note that the efficiency of the optics and the performance of the laser and the OPA will not be the same for the entire wavelength range. The achievable peak intensity/fluence will be determined by the existing optical system and will not be modified. Contact the SXR scientists to discuss specific needs and to confirm whether they can be achieved in this standard configuration of the laser. The expected performance of the OPA is shown below.
The SXR transmission sample system time-tool will be available to record single shot arrival times (t<100 fs) that can be post-sorted. Coarse temporal overlap (t<20 ps) can be obtained via photoelectric effect monitoring on an SMA wire. For some pump wavelengths, finer time zero determination (<300 fs) at the sample can be obtained using an SXR-supplied target to measure the index of refraction change (in reflection) induced by the x-ray beam.
The LJE will be equipped with a newly commissioned X-ray emission spectrometer. The varied line-space plane grating spectrometer is optimized to operate for detection from 250 eV to 2000 eV with an expected resolving power of 1500 to as high as 3000 at lower energies. The spectrometer can operate outside of the optimized energy range with compromised performance. The spectrum is detected with an in-vacuum CCD binned along the spectral energy direction to enable 120Hz readout. In this standard configuration the spectrometer is mounted perpendicular to the x-ray beam in the horizontal plane.
The supported LJE instrument will also have an in vacuum CCD mounted in a transmission geometry in SXR’s monitor tank assembly, located approximately 2 meters downstream of the X-ray interaction. The monitor tank will be outfitted with various transmission edge filters and alignment YAG screens to support X-ray absorption measurements.
LCLS proposals are submitted through the User Portal.
With this standard configuration, SXR will be able to support various time-resolved pump-probe resonant soft x-ray scattering (diffraction) studying the temporal dynamics of charge/spin/orbital orders in solid state materials. Additionally, X-ray absorption (XAS) measurements may also be performed by measuring total fluorescence yield.
X-ray energies ranging from 390 to 2000 eV will be available (700 to 1200 eV for use with DELTA undulator). The SXR monochromator has a resolving power (E/ΔE) of 1000-2000 depending on the photon energy and will be available as part of the standard configuration. The setup will also permit use the x-ray polarization control via the DELTA undulator as well as the high-power fixed linear polarizations available from the LCLS normal operation. Additionally, zeroth order, full SASE beam will be available.
SXR’s KB focusing system can provide foci up to 2 micron (FWHM) and is adjustable in size up to several 100s of microns FWHM.
SLAC National Accelerator Laboratory, Menlo Park, CA
Operated by Stanford University for the U.S. Dept. of Energy