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An Office of Science User Facility

Soft X-ray Materials Science (SXR)

 

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SXR Standard Configuration #1 for Run 16

The liquid jet end station in SXR

Types of Experiments

With this standard configuration, SXR will be able to support various time-resolved pump-probe X-ray emission and/or X-ray absorption experiments examining the ultrafast dynamics for an array of liquid chemistry studies.

X-ray and X-Ray Focus

X-ray energies ranging from 250 to 2000 eV will be available. The SXR monochromator has a resolving power (E/ΔE) of 1000-2000 depending on the photon energy and will be available as part of the standard configuration. Additionally, zeroth order, full SASE beam will be available.

SXR’s KB focusing system can provide foci up to 2 micron (FWHM) and is adjustable in size up to several hundreds of micrometers FWHM.

Optical Pump Lasers

Time-resolved experiments employing tunable femtosecond pulses will be supported under this standard configuration. The fundamental and harmonics (800, 400 and 267 nm) of the SXR, ~50 fs Ti:Sapphire laser will be available, delivered to the sample collinearly with the x-rays, with in-coupling ~800 mm upstream of the sample and with the focusing lens ~1000-1200 mm away from the sample. The configuration can also be used with a TOPAS-Prime Optical Parametric Amplifier (OPA) capable of 480-2400 nm wavelengths. Again, note that the efficiency of the optics and the performance of the laser and the OPA will not be the same for the entire wavelength range. The achievable peak intensity/fluence will be determined by the existing optical system and will not be modified. Contact the SXR scientists to discuss specific needs and to confirm whether they can be achieved in this standard configuration of the laser.    The expected performance of the OPA is shown below.



Timing diagnostics

The SXR transmission sample system time-tool will be available to record single shot arrival times (t<100 fs) that can be post-sorted. Coarse temporal overlap (t<20 ps) can be obtained via photoelectric effect monitoring on an SMA wire. For some pump wavelengths, finer time zero determination (<300 fs) at the sample can be obtained using an SXR-supplied target to measure the index of refraction change (in reflection) induced by the x-ray beam.

LJE mechanical system

There are three translational degrees of freedom for the sample (x, y, z from the manipulator). 

Sample delivery

The liquid jet mechanical system will be available and any sample delivery system compatible with this mechanical system using the standard nozzle rods will be supported. This includes simple capillary based systems and free liquid jets typically of a few micron diameter and flow rates around 10 microliter per minute. Additionally, solid sample targets may be included in this call provided its compatibility with the liquid nozzle rod assembly feedthrough.

Detectors

The LJE will be equipped with a newly commissioned X-ray emission spectrometer. The varied line-space plane grating spectrometer is optimized to operate for detection from 250 eV to 2000 eV with an expected resolving power of 1500 to as high as 3000 at lower energies. The spectrometer can operate outside of the optimized energy range with compromised performance. The spectrum is detected with an in-vacuum CCD binned along the spectral energy direction to enable 120Hz readout. In this standard configuration the spectrometer is mounted perpendicular to the x-ray beam in the horizontal plane.

The supported LJE instrument will also have an in vacuum CCD mounted in a transmission geometry in SXR’s monitor tank assembly, located approximately 2 meters downstream of the X-ray interaction. The monitor tank will be outfitted with various transmission edge filters and alignment YAG screens to support X-ray absorption measurements.

With this configuration, detailed investigations of valence electronic structure and the chemical state for chemically and biologically relevant molecular dynamics are possible both with resonant and non-resonant X-ray emission and absorption spectroscopies.

SXR Instrument Staff

Joshua J. Turner, Bill Schlotter, Alex Reid, Stefan Moeller, Giacomo Coslovich, and Michael P. Minitti

Parameter Table

To be considered for scheduling in this standard configuration, users will be required to include a table in the proposal that lists the specific experimental parameters to ensure compatibility with these configurations. If the experimental parameters are not compatible with the standard configuration or if the table of parameters is incomplete, the proposal will be reviewed and considered for scheduling as general user proposal. Please see the  table of required parameters. No fundamental changes to the standard configurations will occur, but some details of the configuration may be updated in response to inquiries, so users should recheck the website before submitting your proposal to confirm that you have the latest information. Address any questions to the instrument staff.
 
 

LCLS proposals are submitted through the User Portal.


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SXR Standard Configuration #2 for Run 16

The RSXS end station in SXR

Types of Experiments

With this standard configuration, SXR will be able to support various time-resolved pump-probe resonant soft x-ray scattering (diffraction), and RIXS measurements studying the temporal dynamics of charge/spin/orbital orders in solid state materials. Additionally, X-ray absorption (XAS) measurements may also be performed by measuring total fluorescence yield.

X-ray and X-Ray Focus

X-ray energies ranging from 390 to 2000 eV will be available (700 to 1200 eV for use with DELTA undulator). The SXR monochromator has a resolving power (E/ΔE) of 1000-2000 depending on the photon energy and will be available as part of the standard configuration. The setup will also permit use the x-ray polarization control via the DELTA undulator as well as the high-power fixed linear polarizations available from the LCLS normal operation. Additionally, zeroth order, full SASE beam will be available.

SXR’s KB focusing system can provide foci up to 2 micron (FWHM) and is adjustable in size up to several 100s of microns FWHM.

Optical Pump Lasers

Time-resolved experiments employing tunable femtosecond pulses will be supported under this standard configuration. The fundamental (800 nm) of the SXR, ~100 fs Ti:Sapphire laser will be available, delivered to the sample collinearly with the x-rays, with in-coupling ~800 mm upstream of the sample and with the focusing lens ~1000-1200 mm away from the sample. The system can also be used with an HE-TOPAS Optical Parametric Amplifier (OPA) capable of 1150-2400 nm and 4000-17000 nm wavelengths. Again, note that the efficiency of the optics and the performance of the laser and the OPA will not be the same for the entire wavelength range. The achievable peak fluence will be determined by the existing optical system and will not be modified. Contact the SXR scientists to discuss specific needs and to confirm whether they can be achieved in this standard configuration of the laser.

Timing diagnostics

The SXR transmission sample system time-tool will be available to record single shot arrival times (t<100 fs) that can be post-sorted. Coarse temporal overlap (t<20 ps) can be obtained via photoelectric effect monitoring on an SMA wire. For some pump wavelengths, finer time zero determination (<300 fs) at the sample can be obtained using an SXR-supplied target to measure the index of refraction change (in reflection) induced by the x-ray beam.

RSXS Mechanical System

There are total six degrees of freedom for the sample: three translational (x, y, z from manipulator) and three rotational degrees of freedom (Θ,χ,Φ) with a differentially pumped rotary seal.

Detectors

The RSXS end station has two avalanche photodiodes and a multi-channel plate (MCP) detector. These detectors are mounted on a fully motorized in-vacuum detector stage, allowing detector manipulation in both horizontal (360 degrees) & vertical (90 degrees) scattering planes.

A varied line-space plane grating spectrometer, optimized to operate from 250 eV to 2000 eV with an expected resolving power of 1500 to as high as 3000 at lower energies will be offered as well, enabling FEL based RIXS studies. The spectrometer can operate outside of the optimized energy range with compromised performance. The spectrum is detected with an in-vacuum CCD binned along the spectral energy direction to enable 120Hz readout. In this standard configuration the spectrometer is mounted 135° to the x-ray beam in the horizontal plane.

SXR Instrument Staff

Joshua J. Turner, Bill Schlotter, Alex H. Reid, Giacomo Coslovich, and Michael P. Minitti

Parameter Table

To be considered for scheduling in this standard configuration, users will be required to include a table in the proposal that lists the specific experimental parameters to ensure compatibility with these configurations. If the experimental parameters are not compatible with the standard configuration or if the table of parameters is incomplete, the proposal will be reviewed and considered for scheduling as general user proposal. Please see the  table of required parameters. No fundamental changes to the standard configurations will occur, but some details of the configuration may be updated in response to inquiries, so users should recheck the website before submitting your proposal to confirm that you have the latest information. Address any questions to the instrument staff.
 
 

LCLS proposals are submitted through the User Portal.

 

 

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